Cascade Microtech Announces New PureLine Technology -- Measurement Cap

Cascade Microtech Announces New PureLine Technology -- Measurement Capability for Next Generation Devices; PureLine Ensures Low Electrical Intrusion for Noise Sensitive Devices and Tests -- Now and for the Future

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    BEAVERTON, Ore.--(BUSINESS WIRE)--April 12, 2005--Cascade Microtech, Inc. (Nasdaq:CSCD) announces PureLine(TM) technology that ensures low electrical intrusion for noise sensitive devices and tests. PureLine offers advanced capability now -- and for the future on 200mm and 300mm on-wafer probing systems. In order to increase device speed and reduce cost, semiconductor manufacturers have continued to aggressively scale their devices, while moving to new materials and larger 300mm wafers. As a result, the International Test Roadmap for Semiconductors (ITRS) shows continuing momentum towards lower operating voltages. From a test standpoint, this means lower applied stress voltages in Time Dependent Dielectric Breakdown (TDDB) measurements, lower stimulus levels for capacitance, and smaller voltage steps for IV curves.
    "With consumer electronic products requiring higher performance and longer battery life, IC operating voltages will be dramatically reduced to 0.7 Volts and MOS thresholds will fall to 0.14 Volts. At these levels multi-frequency background transmissions can obscure critical measurement data," says John Pence, vice president, engineering products division. "Cascade's new 200mm and 300mm wafer probing systems with PureLine technology offer our customers the breakthrough electrical noise immunity to test existing and future noise sensitive devices."
    This patented technology ensures high immunity from conducted, radiated, and internal noise and has the following system benefits:

Application Requirement PureLine Advantage ---------------------- ----------------------- ----------------------- Time Dependent Precise control of Reduces noise component Dielectric Breakdown lower stress voltages on the applied voltage ---------------------- ----------------------- ----------------------- MOS DC Accurate threshold Unperturbed characterization voltage measurements measurements even with lower gate voltage steps ---------------------- ----------------------- ----------------------- 1/f flicker noise Background radiated Low conducted and test noise must be low generated emissions ---------------------- ----------------------- ----------------------- MOS CV Capacitance Short and load Short and Load cal even calibrations at lower at 5 mV AC stimulus levels ---------------------- ----------------------- -----------------------

    PureLine supports a broad range of on-wafer test processes. From process development through characterization and modeling to long term reliability and failure analysis test, PureLine ensures confidence in your test data and is now available. Visit www.cascademicrotech.com for more information.

    About Us

    Cascade Microtech, Inc. is a worldwide leader in advanced wafer probing solutions for the precise electrical measurement and test of integrated circuits (ICs). Our wafer probing solutions provide connectivity between testers and ICs in wafer form. ICs are ubiquitous in equipment for computing, communications, consumer electronics, automotive, and military applications, such as your cell phone, PDA, or computer. The rapid evolution of IC complexity and cost requires increasingly precise and productive tools to develop and manufacture these devices. Cascade's solutions have accelerated the development of these ICs and their interconnects. Cascade's probing solutions and probe cards perform the precise electrical metrology required to develop new processes and reduce design times and production costs. We also provide electrical metrology solutions for other small structures such as IC packages, circuit boards and modules, MEMs, biological structures, and electro-optic devices.

    This release contains forward-looking statements, including but not limited to those regarding the Company's expectations for IC voltage requirements in next generation devices. These statements reflect management's current views and estimates of market circumstances, industry conditions and company performance. Actual results could vary materially from the description contained herein due to many factors including design and operating decisions made by IC manufacturers and other risks described from time to time in the company's reports to the Securities and Exchange Commission.

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CONTACT: Cascade Microtech, Inc. Ellen Payne, 503-601-1181 ellen_payne@cmicro.com

KEYWORD: OREGON INDUSTRY KEYWORD: HARDWARE COMPUTERS/ELECTRONICS MANUFACTURING PRODUCT PHOTO PHOTOWIRE SOURCE: Cascade Microtech, Inc. PHOTO: 43316

Copyright Business Wire 2005